Photovoltaic silicon wafer detection and sorting
equipment can comprehensively test the quality of photovoltaic silicon wafers,
making it a key piece of equipment for photovoltaic
silicon wafer manufacturing.
The photovoltaic silicon wafer detection and sorting
equipment developed by TZTEK, integrating more than 10 years of machine vision
technology and experience, realizes one-step, high-speed, comprehensive detection and grading of
dimensions, line marks, warpage, breakage, surface defects, latent cracks,
electrical properties, and other characteristics
of monocrystal, polycrystal, and black silicon wafers by incorporating a deep learning AI algorithm. Specifically, it performs
recognition and extraction with high efficiency and a high recognition rate of the characteristics of defects in silicon wafers, and
integrates four major processes in quality control of silicon wafers, including
feeding, full detection, data analysis, and blanking & sorting, into an
automatic intelligent system, so as to meet your requirements for sorting and
detection of silicon wafers and similar products in the new energy sector.
"0" Damage
Non-contact with "0" damage
Data Support
automatically collectiing and uploading real-time inspection and sorting data
Low Cost
Less labour investment , lower total sorting and testing costs