内容标题9

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                  Project Overview
                  TZTEK’s AOI equipment for array processing adopts TZTEK’s independently developed Virgo software platform and a unique platform calibration technology. It is suitable for defect detection in array substrates throughout the manufacturing process, and features fast scanning speed and high imaging accuracy (detection precision of 1.0 μm/1.5 μm available).
                  Program Advantage

                  TZTEK's unique calibration platform technology supports better image stitching and realizes regional detection. Periodic comparison is adopted for the AA zones, while panel-to-panel comparison is adopted for the peripheral zones

                  TZTEK’s independently developed Virgo software platform supports the creation of rectangular, circular, semicircular, and other irregular maps

                  Detection precision of 1.0 μm / 1.5 μm available