The front-end process is a key element of the display
panel manufacturing process. AOI inspection technology is used in the array panel
manufacturing process to monitor appearance defects; the detection precision
and efficiency play a vital role on product yield and cost. The detection of
peripheral circuits and irregular regions is a major quality control problem
faced by the array sections in display factories.
Project Overview
TZTEK’s AOI equipment for array processing adopts TZTEK’s
independently developed Virgo software platform and a unique platform
calibration technology. It is suitable for defect detection in array substrates
throughout the manufacturing process, and features fast scanning speed and high
imaging accuracy (detection precision of 1.0 μm/1.5 μm available).
Program Advantage
1.TZTEK's unique calibration platform technology
supports better image stitching and realizes regional detection. Periodic
comparison is adopted for the AA zones, while panel-to-panel comparison is
adopted for the peripheral zones
2.TZTEK’s independently developed Virgo software
platform supports the creation of rectangular, circular, semicircular, and other
irregular maps
3.Detection precision of 1.0 μm / 1.5 μm available